2025 · Journal
Efficient Security Interface for High-performance Ceph Storage Systems
Khoda Parast, F., Damghani, S.A., Kelly, B., Wang, Y., and Kent, K.B.
Future Generation Computer Systems, Elsevier, 2025
2023 · IEEE Transactions
Koios 2.0: Open-Source Deep Learning Benchmarks for FPGA Architecture and CAD Research
Arora, A., Boutros, A., Damghani, S.A., Mathur, K., Mohanty, V., Anand, T., Elgammal, M.A., Kent, K.B., Betz, V., and John, L.K.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), 2023
2022 · IEEE RSP
Machine Learning-Based Hard/Soft Logic Trade-offs in VTR
Sinha, R., Damghani, S.A., and Kent, K.B.
2022 IEEE International Workshop on Rapid System Prototyping (RSP), Shanghai, China, 2022, pp. 57–63
2022 · IEEE FCCM
Odin-II Partial Technology Mapping for Yosys Coarse-grained Netlists in VTR
Damghani, S.A. and Kent, K.B.
2022 IEEE 30th Annual International Symposium on Field-Programmable Custom Computing Machines (FCCM '22), New York, May 2022
2022 · ACM/SIGDA FPGA
Yosys+Odin-II: The Odin-II Partial Mapper with Yosys Coarse-grained Netlists in VTR
Damghani, S.A. and Kent, K.B.
2022 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays (FPGA '22), Virtual Event, February–March 2022
2021 · IEEE RSP
Heterogeneous Logic Implementation for Adders in VTR
Kaur, H., Krylov, G., Damghani, S.A., and Kent, K.B.
2021 International Workshop on Rapid System Prototyping (RSP '21), Virtual Event, October 2021. IEEE, 2021
2021 · FPL
Koios: A Deep Learning Benchmark Suite for FPGA Architecture and CAD Research
Arora, A., Boutros, A., Rauch, D., Rajen, A., Borda, A., Damghani, S.A., Mehta, S., Kate, S., Patel, P., Kent, K.B., Betz, V., and John, L.K.
2021 International Conference on Field-Programmable Logic and Applications (FPL '21), Virtual Event, May 2021
2020 · IEEE RSP
Desired Footprint by Technology Mapping Modification using a Genetic Algorithm in Odin-II
Damghani, S.A., Legault, J.P., and Kent, K.B.
2020 International Workshop on Rapid System Prototyping (RSP '20), Virtual Event, September 2020, pp. 1–7. IEEE, 2020